If you are already a user you can make a reservation in FBS. To become a new user of this facility, please read the Instrument Reservation Information page. Higher Education/State Agencies: $42/hour.Top view head which allows for high resolution optical imaging of tip and sample.AFM analysis includes section, histogram, roughness, particle analysis, and masking. Open user interface based on IGOR Pro incorporates professional-quality analysis and graphing capabilities.Sample holder for samples up to 3.4″x1.5″, including glass slides and cover slips.Z range of 15 μm the z range can be extended to 40 μm with optional head extended.90 μm by 90 μm scan area with closed looped position control.The cell provides for heating from ambient to 60☌ and can be operated in a fully sealed configuration. Nanoscale topographical changes can be precisely monitored in situ as induced by electro-chemical reactions. The system is also equipped an electrochemistry cell which enables studies of deposition, oxidation, corrosion, and mass transfer of metals and other materials.Lateral Force: Frictional force imaging. Force Mode: Force curve acquisition in Contact or AC mode A recent important application of laterally ordered nanostructures is directed self-assembly (DSA) which is of interest to the semiconductor industry, as lithography methods reach their limits around 10 nm and hence bottom-up methods have become of interest.AC or tapping Mode: Q-controlled imaging using feedback Height, amplitude/phase, deflection signals available.Contact mode: imaging using feedback on deflection Height, deflection and lateral force signals available.The Asylum MFP-3D atomic force microscope (AFM) is equipped with a variety of imaging modes which include: The software was originally written to perform data analysis for my PhD thesis:ĭata analysis, classification and review.Display and plotting of force curve and force volume maps.Loading of binary AFM data into the Igor format.scripts) written for IGOR Pro, a scientific programming and graphing environment by This software offers a basic user interface for analysis of AFM (atomic force microscopy)įorce curves and force volume maps from Bruker (formerly Veeco) Nanoscope files.Microscopy/Surface Analysis Information the Equipment Can Provide Nanomechanics of Confined Polymer Systems. 2016, PhD Thesis, University of Basel, Faculty of Science. The main intent of this software package is to allow reproduction of the data analysis and presentation in the thesis.Īs such, the analysis functions are mostly tailored for indentation of polymer brush-like samples. Major parts of the software deal with brush height analysis. Nevertheless, the software can also be useful as a basis for other AFM force curve analysis. You need to have IGOR Pro in order to run the AFM analysis software. It should also run on Igor for Mac, but that The software has been tested with IGOR Pro 6.3.4 under Windows 7. Open force-curve-analysis.ipf in IGOR and compile the file.Unpack the contents of the zip file into any directory on your computer.Download the afm-forcecurve-analysis.zip file.As long as the Nanoscope data file format does not change, the software should work without The software has been tested with data from Bruker Nanoscope versions 7.3 and 8.1x. The manual for this software is included as a PDF file in the release zip file. Latex format in the doc folder of the repository. ipf files can be directly openend with IGOR Pro. Kept the same so that the individual files can be found from the main force-curve-analysis.ipf file. Primarily it is intended for the analysis of height. This configuration is ideal for customers doing frequent. The system includes a full MFP-3D system (with closed loop AFM scanner), a dedicated nanoindenter head and the nanoindenter optical system. build.sh (currently on Linux only) from the project root folder to automatically generate a zip file in the buildįolder with the necessary files for easy redistribution. Gwyddion is a modular program for SPM (scanning probe microscopy) data visualization and analysis. Combination AFM and Nanoindenting System This configuration provides maximum flexibility and capability for both nanoindenting and AFM imaging. WaveMetrics Igor Pro Geometer's Sketchpad. To also generate the PDF manual from Latex sources, a Tex distribution must be present on the build system.īuild.sh will generate the PDF and add it to the zip file if pdflatex is present on the system. Limited Software Software Limited to Select Lab Computers. If you want to contribute to this open source software, the easiest way is to fork the repository on Github into your Ask a lab consultant for help locating this software. If you have any questions regarding enhancement or use of the software, open an issue here in Github, or contact me directly Acknowledgements Own repository, make your modifications, and the submit a pull request. Janne Hyötylä, Raphael Wagner, software is licensed under the Apache License 2.0.This software was originally developed in Prof.
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